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| 62 | Memory characteristics of top-gate single ZnO nanowire field-effect transistors with Pt nanoparticles embedded in Al2O3 gate oxides |
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E-MRS 2008 Spring Meeting / European Materials Research Society, Strasbourg France / 2008.05.26 - 2008.05.30
Donghyuk Yeom, Jeongmin Kang, Jaewon Jang, Junggwon Yun, Dong-Young Jeong and Sangsig Kim
