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| 42 | Capacitance-voltage characteristics of MOS capacitors with Ge nanocrystals embedded in ZrO2 Gate Material |
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International Conference on Metallurgical Coatings and Thin Films 2007 / Advanced Surface Engineering Division of AVS, San Diego USA / 2007.04.23 - 2007.04.27
H.R. Lee, S.J. Choi, K. Cho, S.S. Kim
