HOME > Publication > Conferences
Conferences
Welcome to KOREA nanotronics
| 16 | I-V Characterization of Single ZnO Nanowire using the Three different Gate Types |
|---|
2005 MRS Fall Meeting / Materials Research Society, Boston USA / 2005.11.29 - 2005.12.01
Dong-Young Jeong, Jihyun Keem, Kyung-hwan Kim, Jeongmin Kang, Changjoon Yoon, Byungdon Min, Kyungah Cho, Sangsig Kim
