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310 Effect of Gate Dielectirc on Electrical Characteristics of Amorphous Indium-Tin-Gallium-Zinc Oxide Thin Film Transistors
The 6th International Conference on Advanced Electromaterials, Jeju, Korea / 2021.11.09 - 2021.11.12
Heesung Kong, Kyoungah Cho, Hosang Lee, Seoungjun Lee, Junhyung Lim and Sangsig Kim