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| 224 | Variation of defect states in amorphous silicon channel layers of thin-film transistors on bendable substrates by mechanical strain |
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20th International Vacuum Congress IVC-20, Busan, Korea / 2016.08.21 - 2016.08.26
Minsuk Kim, Hyungon Oh, Sukhyung Park, Kyoungah Cho and Sangsig Kim
