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Welcome to KOREA nanotronics
| 206 | Effect of performance on tin oxide thin-film transistors under various oxygen partial pressure via radio-frequency sputtering |
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The 3rd International Conference on Advanced Electromaterials, Jeju, Korea / 2015.11.17 - 2015.11.20
Doohyeok Lim, Youngin Jeon, Minsuk Kim, Yoonjoong Kim, and Sangsig Kim
