Publication

HOME > Publication > Journals

Journals

Welcome to KOREA nanotronics

399 Gate-bias stability of triple-gated feedback field-effect transistors with silicon nanosheet channels
Nanotechnology, Vol. 35, No. 27 (2024.04)
Hyojoo Heo, Yunwoo Shin, Jaemin Son, Seungho Ryu, Kyoungah Cho and Sangsig Kim