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| 217 | Gate All Around Metal Oxide Field Transistor: Surface Potential Calculation Method including Doping and Interface Trap Charge and the Effect of Interface Trap Charge on Subthreshold Slope |
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Journal of Semiconductor Technology and Science, Vol.13, pp. 530-537, (2013, 10)
Faraz Najam, Sangsig Kim, and Yun Seop Yu
