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| 208 | Interface Trap Density of Gate-All-Around Silicon Nanowire Field-Effect Transistors With TiN Gate: Extraction and Compact Model |
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IEEE TRANSACTIONS ON ELECTRON DEVICES, Vol. 60, pp. 2457-2463, (2013.08)
Faraz Najam, Yun Seop Yu, Keun Hwi Cho, Kyoung Hwan Yeo, Dong-Won Kim, Jong Seung Hwang, Sangsig Kim, and Sung Woo Hwang
