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| 199 | Quantitative Extraction of Temperature-dependent Barrier Height and Channel Resistance of a-SIZO/OMO and a-SIZO/IZO Thin Film Transistors |
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IEEE Electron Device Letters Vol. 34, pp. 247-249, (2013.02)
K. Heo, B. H. Hong, E. H. Lee, S. Y. Lee, S. Kim, and S. W. Hwang
