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| 158 | Investigation Of spatial and energetic trap distributions in 1nm EOT SiO2/HfO2 By discharging-sweep mode amplitude charge pumping |
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Solid State Sciences, Vol. 13, Issue 6, pp. 1360-1363 (2011.06)
Eunae Chung, Kabjin Nam, Youngpil Kim, Jiyoung Min, Moonju Cho, Hyungseok Hong, Jeong Han, Jaeduk Lee, Yugyun Shin, Siyoung Choi, Sangsig Kim
