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| 148 | Spatial distribution of interface traps in sub-50 nm recess-channel-type DRAM cell transistors |
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IEEE Electron Device Letters, Vol 32, pp. 81-83 (2011.01)
Eunae Chung, Youngpil Kim, Minchul Park, Kabjin Nam, Jiyoung Min, Giyoung Yang, Yugyun Shin, Siyoung Choi, Gyoyoung Jin, Jootae Moon, Sangsig Kim
