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Electrical Characteristics of Floating-Gate Memory Devices with Titanium Nanoparticles Embedded in Gate Oxides
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Journal of Nanoscience and Nanotechnology, Vol. 9, pp1904-1998 (2009.01)
Byoungjun Park, Kyoungah Cho, Junggwon Yun, Yongseo Koo, Jongho Lee and Sangsig Kim