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Welcome to KOREA nanotronics
71
Capacitance-voltage characterization of Ge-nanocrystal-embedded MOS capacitors with a capping Al2O3 layer
Semiconductor Science and Technology Vol.21, 378-381 (2006.02)
Samjongchoi, Byoungjun Park, Hyunsuk Kim, Kyoungah Cho, Sangsig